We’re excited to be showcasing our latest power testing solutions at the IEEE Applied Power Electronics Conference, March 22–26, 2026, at the Henry B. Gonzalez Convention Center.
If you're tackling the latest power electronics challenges, you'll find measurement solutions to unlock the next generation of designs.
- Enable high channel count parallel testing
- Correlate 3-phase inverter performance with robotic motion
- Power the next generation of AI servers with confidence
- Simplify double pulse testing for production and validation
- Ensure accurate, repeatable double pulse testing for SiC and GaN designs
- Unlock 3-channel high-power bidirectional testing
Download the flyer to learn more about our demos. If you're attending, stop by to see the solutions in action and connect with our experts. If not, explore the technologies or book a demo with our team.